Process Dependence of Soft Errors Induced by Alpha Particles, Heavy Ions, and High Energy Neutrons on Flip Flops in FDSOI
Soft-error tolerance depending on threshold voltage of Kitchen transistors was evaluated by α -particle, heavy-ion, and neutron irradiation.Three chips were fabricated, one embeds low-threshold general-purpose (GP) transistors and the others embed high-threshold low-power (LP) transistors in a 65 nm fully depleted silicon on insulator (FDSOI